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| MRC | Criteria | Characteristic |
|---|---|---|
| CZEQ | Time Rating Per Chacteristic | 350.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, LOW TO HIGH LEVEL OUTPUT AND 350.00 NANOSECONDS MAXIMUM PROPAGATION DELAY TIME, HIGH TO LOW LEVEL OUTPUT |
| AFJQ | Storage Temp Range | -55.0/+150.0 DEG CELSIUS |
| CQZP | Input Circuit Pattern | 7 INPUT |
| ADAT | Body Width | 0.290 INCHES MAXIMUM |
| CQSJ | Inclosure Material | CERAMIC AND METAL |
| CSSL | Design Function And Quantity | 2 SHIFT REGISTER, STATIC |
| CBBL | Features Provided | MONOLITHIC AND HERMETICALLY SEALED AND NEGATIVE OUTPUTS AND POSITIVE OUTPUTS |
| ADAQ | Body Length | 0.830 INCHES MAXIMUM |
| MRC | Decoded Requirement | Clear Text Reply |
| AEHX | Maximum Power Dissipation Rating | 280.0 MILLIWATTS |
| ADAU | Body Height | 0.150 INCHES MAXIMUM |
| AFGA | Operating Temp Range | -25.0/+85.0 DEG CELSIUS |
| CQSZ | Inclosure Configuration | DUAL-IN-LINE |
| CQWX | Output Logic Form | P-TYPE METAL OXIDE-SEMICONDUCTOR LOGIC |
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AS9120B and ISO 9001:2015 |
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AS 6081:2012 Certification |
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ESD S20.20-2014 Certification |
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