Obtain a Quote for Lattice Semiconductor Corp Part Number ISPLSI2128E-180LT176 Now

Part Number:  ISPLSI2128E-180LT176
Alternate P/N:  ISPLSI2128E180LT176
Manufacturer:  Lattice Semiconductor Corp
NIIN:  01-522-4282
Item Name :  microcircuit memory
CAGE Code:  66675
INC Code :  41015
Country:  USA
NCB Code:  01

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NSN Information for Part Number ISPLSI2128E-180LT176 with NSN 5962-01-522-4282, 5962015224282

NSNFSCNIINCLSHazmatDEMILCancelled NSN
5962-01-522-4282

Item PartTypeName:

MICROCIRCUIT,MEMORY

59620152242820NB
CIICHCCESDPMICCriticalityENAC
UBA0
Part NumberISCRNVCRNCCHCCMSDSSADC
356A1409P36523

Characteristics Data of NSN 5962-01-522-4282, 5962015224282

MRCCriteriaCharacteristic
CQSZINCLOSURE CONFIGURATIONLEADED CHIP CARRIER
TESTTEST DATA DOCUMENT89954-35611407 DRAWING (THIS IS THE BASIC GOVERNING DRAWING, SUCH AS A CONTRACTOR DRAWING, ORIGINAL EQUIPMENT MANUFACTURER DRAWING, ETC.; EXCLUDES ANY SPECIFICATION, STANDARD OR OTHER DOCUMENT THAT MAY BE REFERENCED IN A BASIC GOVERNING DRAWING)
CZEPCAPITANCE RATING PER CHARACTERISTIC8.00 INPUT PICOFARADS NOMINAL
TTQYTERMINAL TYPE AND QUANTITY176 GULLWING
ADAQBODY LENGTH24.0 MILLIMETERS NOMINAL
ADATBODY WIDTH24.0 MILLIMETERS NOMINAL
CBBLFEATURES PROVIDEDELECTROSTATIC SENSITIVE
CQWXOUTPUT LOGIC FORMCOMPLEMENTARY-METAL OXIDE-SEMICONDUCTOR LOGIC
FEATSPECIAL FEATURES6000 PLD GATES
AFGAOPERATING TEMP RANGE-55.0 TO 125.0 DEG CELSIUS
ADAUBODY HEIGHT1.3 MILLIMETERS MINIMUM AND 1.4 MILLIMETERS MAXIMUM
AFJQSTORAGE TEMP RANGE-65.0 TO 150.0 DEG CELSIUS
CTQXCURRENT RATING PER CHARACTERISTIC165.00 MILLIAMPERES NOMINAL SUPPLY
CXCYPART NAME ASSIGNED BY CONTROLLING AGENCYMICROCIRCUIT, DIGITAL (MEMORY) COMPLEX PROGRAMABLE LOGIC DEVICE (CPLD)
AGAVIII END ITEM IDENTIFICATIONC-17A AIRCRAFT
CZENVOLTAGE RATING AND TYPE PER CHARACTERISTIC-0.5 VOLTS MAXIMUM POWER SOURCE AND 7.0 VOLTS MAXIMUM POWER SOURCE
CQSJINCLOSURE MATERIALPLASTIC
CRTLCRITICALITY CODE JUSTIFICATIONCBBL
CZEQTIME RATING PER CHACTERISTIC5.00 NANOSECONDS NOMINAL PROPAGATION DELAY
SPCLSPECIAL TEST FEATURESUPSCREENING TESTING CONSISTING OF EXTENDED TEMERATURE RANGE TESTING OF PEM
CZERMEMORY DEVICE TYPEPAL

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